Oxford Instruments Analytical GmbH


Oxford Instruments is a leading provider of high-technology X-Ray Fluorescence (XRF), Laser Induced Breakdown Spectroscopy (LIBS) instrumentation and Optical Emissions Spectroscopy (OES). Our analysers are used world-wide for materials analysis, coating thickness measurement, product optimisation and research applications. The products incorporate the latest field proven technology coupled with over 30 years of experience in designing, producing and supporting world class instruments.

Experts in portable XRF analysis since 1976
The X-MET8000 range of handheld XRF analysers, delivers the high performance required even in the most demanding applications, by using the optimised combination of a high performance X-ray tube and a large area silicon-drift detector (SDD). X-MET8000 Series XRF Analysers, include three models: Smart; Optimum and Expert to suit all analysis needs and budgets.

The world’s first and fastest handheld LIBS analyser
The mPulse was the first ever handheld Laser Induced Breakdown Spectroscopy (LIBS) metals analyser available on the market. Two models, mPulse and mPulse+ enable users to identify a wide variety of metal alloys at the press of the trigger and measure light and heavy elements up to 10 times faster than any handheld XRF instrument on the market. With no costly detector or limited lifetime X-ray tube to replace, maintenance and repair costs are low.

Mobile and portable OES
Seamless quality control is essential in the metals industry at multiple stages of production. Oxford Instruments offers mobile and stationary optical emission spectrometers (OES) for tramp element analysis for scrap, inspection of in-coming materials, QA/QC in the foundry process (including nitrogen analysis in duplex steels), outgoing goods and safety-critical positive material identification on-site.

Robert van Laak
+49 2825 9383 329
Find us at S 24

Product and Service Categories

  • Electromagnetic Testing (ET)
    • Coating Thickness Meters
    • Magnetic Induction Coating Measurement
  • Materials Characterisation (MC)
    • Spectrometers
    • X-ray Fluorescence
  • Radiographic Testing (RT)
    • X-ray - Tubes


Steffi Dehlau
German Society for Non-Destructive Testing (DGZfP)
Max-Planck-Str. 6
12489 Berlin Germany
Tel: +49 30 67807-120

WCNDT 2016

The 19th World Conference on Non-Destructive Testing from 13-17 June 2016 in Munich, Germany is the most important event in our global NDT community.

You are cordially invited.